Phase-Diffusion in Switching Process of Underdamped Josephson Junctions

Xinsheng Tan,ShanHua Cong,Cheng Pan,Yang Yu,Guozhu Sun,Jian Chen,Peiheng Wu
DOI: https://doi.org/10.1109/TASC.2010.2093857
2011-01-01
Abstract:We measured the switching from a superconducting state to a finite voltage state in a dc SQUID, which is equivalent to a single Josephson junction with tunable critical current Ic. The width and the mean of the switching current distribution depend on the effective temperature Teff and Ic. The phase-diffusion was observed by investigating the switching current distribution as a function of Teff. It is found that the crossover from the thermal activation to the phase-diffusion scaling with the ratio of Ic and Teff, clarifying the physical picture of the phase-diffusion. We developed an analytical multi-retrapping model which can address the experimental results very well.
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