Time-Resolved Measurement of Capacitance in A Josephson Tunnel Junction

Guozhu Sun,Jian Chen,Zhengming Ji,Weiwei Xu,Lin Kang,Peiheng Wu,Ning Dong,Guangfeng Mao,Yang Yu,Dingyu Xing
DOI: https://doi.org/10.1063/1.2338778
IF: 4
2006-01-01
Applied Physics Letters
Abstract:The capacitance of a Josephson tunnel junction is an important parameter, which determines its plasma frequency ωp and thus the energy level spacing in the quantum regime. When a microwave signal at the frequency of ω is applied to a current-biased junction in its zero-voltage state, the escape rate from this state is somehow enhanced. The enhancement is expected to go through a pronounced maximum when ωp=ω. Making use of such microwave generated resonant activation in the thermal regime, we have developed a time-resolved measurement scheme for determining the junction capacitance with an uncertainty of less than 2%.
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