Measurement of Energy Relaxation Time in A Microwave-Driven Josephson Junction

Guozhu Sun,Yiwen Wang,Junyu Cao,Jian Chen,Zhengming Ji,Lin Kang,Weiwei Xu,Yang Yu,Siyuan Han
DOI: https://doi.org/10.1088/0953-2048/20/11/s26
2007-01-01
Abstract:The switching current distributions P(I) with different sweep rates are obtained in microwave-driven current-biased Josephson tunnel junctions. We observe the resonant peak caused by microwave-assisted tunneling in P(I). By measuring the magnitude of the microwave resonant peak as a function of the sweep rate, we develop a novel method of extracting the energy relaxation time T-1 of the junction. With this simple method, it is determined that T-1 of a Nb/AlOx/Nb Josephson junction is approximately 0.5 mu s.
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