Resonant Phase Escape in Bi2Sr2CaCu2O8+δsurface Intrinsic Josephson Junctions

H. F. Yu,X. B. Zhu,J. K. Ren,Z. H. Peng,D. J. Cui,H. Deng,W. H. Cao,Ye Tian,G. H. Chen,D. N. Zheng,X. N. Jing,Li Lu,S. P. Zhao
DOI: https://doi.org/10.1088/1367-2630/15/9/095006
2013-01-01
New Journal of Physics
Abstract:We present a study of phase escape in surface Bi2Sr2CaCu2O8+delta intrinsic Josephson junctions in the presence of microwave radiation. The measured switching current distributions display clear double-peak structures in the microwave field, which result from the single-and two-photon resonant escape processes accompanied by microwave-induced potential barrier suppression. We show that these results can be well explained by a quantum-mechanical model proposed by Fistul et al (2003 Phys. Rev. B 68 060504), from which the power and frequency dependences of the switching current distributions can be reproduced.
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