New Applications for Ultra-High Brightness LaB6 Nanowire Cathode

Han Zhang,Jie Tang,Lu-chang Qin,Yu Jimbo,Akira Niwata,Shinichi Kitamura,Hironobu Manabe
DOI: https://doi.org/10.1109/ivnc.2018.8520025
2018-01-01
Abstract:Electron microscopy is probably the most demanding application for a high brightness electron source. This is because the electromagnetic lens is with both chromatic and spherical aberrations. Those lens imperfections put limits on the focusable electrons, which are required to, as much as possible, originate from a small area before spreading over a small angle as per unit velocity. Brightness and energy spread, two quantities closely related to such requirements, are therefore most important in predicting an achievable resolution for an electron optical system. A third crucial factor is stability, a general requirement from the perspective of commercial instruments, which must deliver guarantee-able performance in a repeatable manner. This work will introduce a nano-emitter which prevails over current electron sources in respect of the above-mentioned three qualities.
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