High Brightness Electron Sources For Mev Ultrafast Diffraction And Microscopy

p musumeci,r k li
DOI: https://doi.org/10.1117/12.2062997
2014-01-01
Abstract:In this paper we review the present status of MeV electron sources for ultrafast diffraction and microscopy applications and trace the path forward to improve the spatio-temporal resolution of electron scattering probes.
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