Abstract:Nanoscale thermal imaging and temperature detection are of fundamental importance in diverse scientific and technological realms. Most nanoscale thermometry techniques focus on probing the temperature of lattice or phonons and are insensitive to nonequilibrium electrons, commonly referred to as "hot electrons." While terahertz scanning noise microscopy (SNoiM) has been demonstrated to be powerful in the thermal imaging of hot electrons, prior studies have been limited to room temperature. In this work, we report the development of a cryogenic SNoiM (Cryo-SNoiM) tailored for quantitative hot electron temperature detection at low temperatures. The microscope features a special two-chamber design where the sensitive terahertz detector, housed in a vacuum chamber, is efficiently cooled to ∼5 K using a pulse tube cryocooler. In a separate chamber, the atomic force microscope and the sample can be maintained at room temperature under ambient/vacuum conditions or cooled to ∼110 K via liquid nitrogen. This unique dual-chamber cooling system design enhances the efficacy of SNoiM measurements at low temperatures. It not only facilitates the pre-selection of tips at room temperature before cooling but also enables the quantitative derivation of local electron temperature without reliance on any adjustable parameters. The performance of Cryo-SNoiM is demonstrated through imaging the distribution of hot electrons in a cold, self-heated narrow metal wire. This instrumental innovation holds great promise for applications in imaging low-temperature hot electron dynamics and nonequilibrium transport phenomena across various material systems.

Scanning THz Noise Microscopy of Operating Nano-devices

Real-space nano-imaging of hot electron dynamics

Imaging of Nonlocal Hot-Electron Energy Dissipation Via Shot Noise

Hot Electron Nano-Imaging and Real-Space Energy Dissipation of Operating Microelectronic Devices at Room-Temperature

Nanoscale thermal imaging of hot electrons by cryogenic terahertz scanning noise microscopy

Nanothermometry of Electrons and Phonons

Quantitative Thermal Imaging of Single-Walled Carbon Nanotube Devices by Scanning Joule Expansion Microscopy.

Anisotropic Hot-Electron Kinetics Revealed By Terahertz Fluctuation

Nanoscale imaging of phonon dynamics by electron microscopy

Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices

A Terahertz Confocal Microscope for Far-Field Thermal Radiation Detection and Near-Field Sub-Wavelength Imaging

Ultrafast optical nanoscopy of carrier dynamics in silicon nanowires

Probing Surface Evanescent Waves with an Ultra-High Sensitive Terahertz Near-Field Microscope

Nanosecond nanothermometry in an electron microscope

Quasiadiabatic Electron Transport in Room Temperature Nanoelectronic Devices Induced by Hot-Phonon Bottleneck

Non-Planckian Infrared Emission from GaAs Devices with Electrons and Lattice Out-of-thermal-equilibrium

Terahertz spin currents in nanoscale spatial resolution

Real-space sampling of terahertz waveforms under scanning tunneling microscope

Low terahertz-band scanning near-field microscope with 155-nm resolution

Scanning Cathodoluminescence Microscopy: Applications in Semiconductor and Metallic Nanostructures

Hyperspectral electromechanical imaging at the nanoscale: Dynamical backaction, dissipation and quantum fluctuations