A Hierarchical Multiclassifier System for Automated Analysis of Delayered IC Images

Deruo Cheng,Yiqiong Shi,Bah-Hwee Gwee,Kar-Ann Toh,Tong Lin

DOI: https://doi.org/10.1109/mis.2018.2886669

IF: 6.744

2019-01-01

IEEE Intelligent Systems

Abstract:A robust and accurate machine learning based hierarchical multiclassifier system is proposed to automate the retrieval of interconnection information from delayered integrated circuits images. The proposed system replaces labor-intensive manual annotation process and provides an effective approach for the automated analysis of state-of-the-art deep submicron IC chips.