Hybrid Unsupervised Clustering for Pretext Distribution Learning in IC Image Analysis

Yee-Yang Tee,Xuenong Hong,Deruo Cheng,Tong Lin,Yiqiong Shi,Bah-Hwee Gwee
DOI: https://doi.org/10.1109/ipfa55383.2022.9915730
2022-01-01
Abstract:Delayered integrated circuit image analysis is an important step in hardware assurance, which is typically performed by automated approaches such as deep learning. The data dependent deep learning techniques require a diverse set of training data containing most of the variations in the delayered circuit images to perform well, which can be highly challenging to curate. In this paper, we present a hybrid unsupervised clustering method that aims to learn the distribution of newly acquired circuit image datasets, to aid the subsequent analysis flow. Our method consists of a deep learning-based feature extractor stage and a feature clustering stage, and we evaluate the performance of several feature extraction networks and clustering algorithms. Experimental results show that our method could obtain a promising normalized mutual information (NMI) score of 0.6095 on a dataset of delayered IC images taken of a manufactured Integrated Circuit (IC), and demonstrates excellent ability to retrieve visually similar images when provided with query images.
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