An Experiment Study on AC Conductivity of Conductive Ink Film at Microwave X-band

Fei-fei Li,Yin Poo,Rui-xin Wu
DOI: https://doi.org/10.1109/iwat.2018.8379155
2018-01-01
Abstract:Utilizing the transmission /reflection measurement method, we investigated the complex conductivity of conductive ink films at microwave X-band. The results show that the frequency dependence of the complex conductivity is in good agreement with the Drude model. However, the retrieved plasmon frequency ω p and the collision frequency ω τ are much lower than those of metal materials. The effect of surface morphology of the films on complex conductivity was investigated. The study provides a solid foundation for the applications of conductive ink films, such as wideband absorber designs.
What problem does this paper attempt to address?