Development of Boundary Scan Test Platform Based on Nios

YANG Chun-ling,PENG Li-zhang
DOI: https://doi.org/10.3969/j.issn.1005-9490.2007.06.040
2007-01-01
Abstract:The paper describes an original design of Boundary Scan Test System based on NIOS and brings up a more flexible and effective embedded system solution, which makes use of SOPC technology. This scheme integrates multiple function modules on a low cost and high density FPGA, which is developed with embedded NIOS CPU by Altera corporation. It improves the flexibility of design, testing efficiency of boundary scan system and speed rate of fetching data. At the same time, the application of USB interface technology make the boundary scan test system have these advantages, hot-plug and fast rate of transmission. The design of JTAG bus controlling module and the development of USB firmware on NIOS system is presented.The experimental result has proved the design correct and effective, which is capable of processing fault diagnosis accurately.
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