Stochastic Model for Quantifying Effect of Surface Roughness on Light Reflection by Diffuse Reflectance Standards

Peng Tian,Xun Chen,Jiahong Jin,Jun Q. Lu,Xiaohui Liang,Xin-Hua Hu
DOI: https://doi.org/10.1117/1.oe.57.9.094104
IF: 1.3
2018-01-01
Optical Engineering
Abstract:Diffuse reflectance standards of known hemispherical reflectance R-h are widely used in optical and imaging studies. We have developed a stochastic surface model to investigate light reflection and roughness dependence. Through Monte Carlo simulations, the angle-resolved distributions of reflected light have been modeled as the results of local surface reflection with a constant reflectance R-s representing the overall ability of a reflectance standard. The surface was modeled by an ensemble of random Gaussian surface profiles parameterized by a mean surface height delta and transverse correlation length a. By decreasing delta/a, the calculated reflected light distributions were found to transit from Lambertian to specular reflection regime. Reflected light distributions were measured with three standards by nominal reflectance R-h valued at 10%, 80%, and 99%. The calculated results agree well with the measured data in their angular distributions at different incident angles by setting R-s = R(h )and delta = a = 3.5 mu m. (C) 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)
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