Finite Element Model Optimization and Thermal Network Parameter Extraction of Press-Pack IGBT

Hai Ren,Wei Lai,Zeshen Jiang,Shengyang Kang,Ran Yao,Li Ran,Hui Li,Rui Jin,Jialiang Wen
DOI: https://doi.org/10.1109/apec.2018.8341428
2018-01-01
Abstract:The junction temperatures of multiple chips in a press-pack IGBT device cannot be all measured directly. Finite element modeling is a powerful tool to investigate internal temperature distribution. In order to evaluate the performance of the press-pack structure, a computationally more efficient thermal network can be extracted to analyze coupled electro-thermal behavior under variable ambient and operating conditions. This paper describes an approach to derive such a thermal network model, based on superimposition using a series of FE modeling results. As a result, it is possible to establish a multiple input multiple output (MIMO) thermal network model, given the dimensions of a press-pack design and the material property. The paper illustrates the accuracy of the FE modeling approach using experiment on a single-chip device. In addition, this paper also proposes an improved Foster model of press-pack IGBT devices, taking into account the thermal coupling effect between chips. A relationship between the coupling thermal impedance and chip distance is established to simplify the calculation of some model parameters. The comparison between the thermal network model and FE model of a six-chip device under power cycling condition demonstrates the validity of the proposed model.
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