Glass-Copper Anodic Bonding Through Activated Sn-0.6Al Solder

Guangjie Feng,Zhuoran Li,Xiaolong Xu,Zhongke Shen,Yong Yang
DOI: https://doi.org/10.1016/j.jmatprotec.2017.11.038
IF: 6.3
2018-01-01
Journal of Materials Processing Technology
Abstract:The application of an electric field promoted the migration of Na+ ions on the glass substrate. A sodium-depleted layer was formed on the glass surface, playing a key role in a successful bonding. Al accumulated at the glass/solder interface and enhanced the interfacial reactions. Al2O3+Al2SiO5+SnO, Cu6Sn5 and Cu3Sn reaction layers were respectively detected on both sides. The electric field and bonding temperature were varied to illustrate their impact on the interfacial bonding. The joint formation mechanism is discussed. When the bonding voltage was 1400V and the bonding temperature was 400°C, the glass/copper joint was free of cracks, and had a maximum shear strength of 11.5MPa.
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