Device Simulation and Modeling of RRAM Switching Processes

Zhiping Yu,Jinyu Zhang
DOI: https://doi.org/10.1109/inec.2016.7589452
2016-01-01
Abstract:On the emerging nonvolatile memory (NVM) devices, resistive-switching RAMs (ReRAM or RRAM), are considered as promising next-generation structures. All types of RRAMs (TMO, CBRAM, CMO, and etc.) work under the same principle of conductive-filament forming and rupturing in the switching layer of the two-terminal devices. This switching mechanism is to differentiate RRAM from other types of NVMs such as PCM (phase-change memory) and STT-MRAM (spin-transfer torque magnetic RAM). This talk describes the device simulation and modeling of switching process in RRAMs and in particular, the conductive-bridge RAMs (CBRAMs). Specifically, 3D kinetic Monte-Carlo (3D-KMC) simulation and a compact model for the forming of filament will be presented. A review of state-of-the-art in this research field is provided.
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