Shock Calibration of Piezoresistive High-Gn Microaccelerometer

郇勇,张泰华,杨业敏,王钻开,陆德仁
DOI: https://doi.org/10.3969/j.issn.1000-9787.2003.11.027
2003-01-01
Abstract:A piezoresistive highgn microaccelerometer, whose capacity is designed up to 50#000#gn,has been developed by using silicon micromachining and diffusion techniques.The chip is made of singlecrystal silicon and is packaged with ceramics.In order to determine the dynamic sensitivity,shock calibration tests are performed by using Hopkinson bar at up to 40#000#gn acceleration level.The microaccelerometer has a measured sensitivity of 1.26 μV/gn with a 6.33#V bridge excitation voltage.
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