A charge conservation statistics enhancement method used in semiconductor device monte carlo simulation

杜刚,刘晓彦,孙雷,韩汝琦
DOI: https://doi.org/10.3969/j.issn.1001-246X.2001.06.004
2001-01-01
Abstract:A charge conservation statistics enhancement method used in semiconductor divice Monte Carlo simulation is approached,which smoothes the charge fluctuation caused by the statistics enhancement, and keeps the continuation of cross edge charge flow. As an example, Schottky barrier diode characteristics is simulated using this method.
What problem does this paper attempt to address?