Simulation of Bipolar Charge Transport with Trapping and Recombination in Polymeric Insulators Using Runge–Kutta Discontinuous Galerkin Method

Jihuan Tian,Jun Zou,Yunshan Wang,Jie Liu,Jiansheng Yuan,Yuanxiang Zhou
DOI: https://doi.org/10.1088/0022-3727/41/19/195416
2008-01-01
Abstract:The widely used QUICKEST method with ULTIMATE flux limiter is not capable of solving the charge transport problems with a very steep wavefront accurately, due to the wide stencil adopted. Furthermore, the splitting process of separating the convection and the reaction terms in the method introduces additional errors. To solve such problems accurately, a novel numerical method based on the Runge-Kutta discontinuous Galerkin (RKDG) method is introduced in this paper, which has high-order resolution and weak correlation between cells. The bipolar charge transport under dc voltage in solid dielectrics with trapping and recombination is simulated using this new method. The results of charge profiles provided by the method are obviously different from the simulation results in the existing literature. The method was verified by problems with analytical solution and experimental observations.
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