Calculation and Analysis of Multifractal Spectrum of Low Silicon Sinter

崔志敏,李秀景,陈颖,张庆军,张玉柱
DOI: https://doi.org/10.13228/j.boyuan.issn1001-0963.2014.04.013
2014-01-01
Abstract:Low silica sinter samples with different basicity were prepared by sintering pot tests. SEM was used to characterize the surface morphology of samples. Multifractal spectrums of sinter with different basicity were analyzed by multifractal software. The width of the multi-fractal spectrum increases and the sinter surface morphology becomes more complex with the improvement of basicity,consistent with the SEM image; the subset dimension difference of the maximum and minimum probability reduces,and changes from positive to negative,the structure of sinter pore is mainly microscopic by competition between macropores and micropores. The distribution of sinter pores is quantitatively characterized by multi-fractal spectrum,which is consistent with SEM images.
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