Bipolar Resistive Switching Effect in BiFeO 3 /Nb:SrTiO 3 Heterostructure by RF Sputtering at Room Temperature

Pengfei Wang,Hui Zhu,Yingqiao Zhang,Shiwei Feng,Chunsheng Guo,Yamin Zhang,Xiao Meng,Qiong Qi
DOI: https://doi.org/10.1007/s11595-018-1975-9
2018-01-01
Journal of Wuhan University of Technology-Mater. Sci. Ed.
Abstract:The (001) oriented BiFeO 3 thin film was deposited on the Nb: SrTiO 3 substrate by radio frequency magnetron sputtering technology, and the bipolar resistive switching effect was observed in the BiFeO 3 /Nb: SrTiO 3 heterostructure. The results showed that the ratio between the high resistance and low resistance was more than two orders at a reading pulse of -0.5 V and it exhibited excellent retention over 3600 s. The current density-voltage characteristic was dominated by the space-charge-limited conduction. The resistive switching effect of the structure was attributed to the trapping/detrapping of the charge carriers.
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