Green Laser Diodes with Low Threshold Current Density Via Interface Engineering of InGaN/GaN Quantum Well Active Region.

Aiqin Tian,Jianping Liu,Liqun Zhang,Zengcheng Li,Masao Ikeda,Shuming Zhang,Deyao Li,Pengyan Wen,Feng Zhang,Yang Cheng,Xiaowang Fan,Hui Yang
DOI: https://doi.org/10.1364/oe.25.000415
IF: 3.8
2017-01-01
Optics Express
Abstract:By observing the morphology evolution of green InGaN/GaN quantum well (QW) and studying the catholuminescence (CL) property, we investigate indium-segregation-related defects that are formed at green InGaN/GaN QW interfaces. Meanwhile, we also propose the approach and suggest the mechanism to remove them for green InGaN/GaN QW grown on both GaN templates and free-standing GaN substrates. By engineering the interface of green InGaN/GaN QWs, we have achieved green laser diode (LD) structure with low threshold current density of 1.85 kA cm-2. The output power of the green LD is 58 mW at a current density of 6 kA cm-2 under continuous-wave operation at room temperature.
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