Note: Electron Energy Spectroscopy Mapping of Surface with Scanning Tunneling Microscope.

Meng Li,Chunkai Xu,Panke Zhang,Zhean Li,Xiangjun Chen
DOI: https://doi.org/10.1063/1.4960716
2016-01-01
Abstract:We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.
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