Abstract:Field emission microscopy (FEM) is commonly used to observe patterns and intensities of electron emissions and to estimate the average work function from the emission current with respect to the applied voltage (FN plots). However, it is di‹cult to observe the nanostructure at the apex of the tip using only ˆeld emission microscopy. In this research, we observed the nanostructure of a single crystal tungsten〈100〉electron emitter covered with barium aluminate by using scanning probe microscopy (SPM). We were able to observe the terrace structure at the top of single crystal tungsten〈100〉electron emitter tip. Furthermore, we investigated the correlation between ˆeld emission pattern by the FEM and nanostructure of the electron emitter tip by the SPM.

Characterization of an Electron Emitting Tip by Field Emission Microscope and Scanning Probe Microscope