Abstract:We report on the application of Atomic Force Microscopy (AFM) for studying the Field Emission (FE) properties of a dense array of long and vertically quasi-aligned multi-walled carbon nanotubes grown by catalytic Chemical Vapor Deposition on a silicon substrate. The use of nanometric probes enables local field emission measurements allowing investigation of effects non detectable with a conventional parallel plate setup, where the emission current is averaged on a large sample area. The micrometric inter-electrode distance let achieve high electric fields with a modest voltage source. Those features allowed us to characterize field emission for macroscopic electric fields up to 250 V/$\mu$m and attain current densities larger than 10$^5$ A/cm$^2$. FE behaviour is analyzed in the framework of the Fowler-Nordheim theory. A field enhancement factor $\gamma \approx$ 40-50 and a turn-on field $E_{turn-on} \sim$15 V/$\mu$m at an inter-electrode distance of 1 $\mu$m are estimated. Current saturation observed at high voltages in the I-V characteristics is explained in terms of a series resistance of the order of M$\Omega$. Additional effects as electrical conditioning, CNT degradation, response to laser irradiation and time stability are investigated and discussed.

Study of Field Emission from Single-Walled Carbon Nanotubes Using Probe-Hole Method

In-situ studies of electron field emission of single carbon nanotubes inside the TEM

Quantitative analysis of electron field-emission characteristics of individual carbon nanotubes: The importance of the tip structure

Field emission properties of single-wall carbon nanotubes studied by FEM

A study on field emission patterns of single-walled carbon nanotubes

Observations of Carbon Nanotube Field Emission Failure in the Transmission Electron Microscope

FIELD EMISSION MICROSCOPY STUDY OF THE WORK FUNCTION OF SINGLE-WALLED CARBON NANOTUBES

A Study of Field Emission of Single-Walled Carbon Nanotubes Using Field Emission Microscopy

Field Emission From Short And Stubby Vertically Aligned Carbon Nanotubes

Field emission patterns with atomic resolution of single-walled carbon nanotubes by field emission microscopy

Fem Study on the Influence of Oxygen on Field Emission of Single-Walled Carbon Nanotubes

Atomically Resolved Field Emission Patterns of Single-Walled Carbon Nanotubes

Field Electron Emission From Individual Carbon Nanotubes Of A Vertically Aligned Array

Study of Field Emission Microscopic Images Originated from Coherent Scattering of Multiwalled Carbon Nanotubes

Field emission from single multi-wall carbon nanotubes

Field-ion Microscope Study of Single-walled Carbon Nanotube

Local probing of the field emission stability of vertically aligned multiwalled carbon nanotubes

Electron Source for Carbon Nanotube Field Emission

A local field emission study of partially aligned carbon-nanotubes by AFM probe

Effect of Temperature on Field Emission from a Micrometer-Long Single-Walled Carbon Nanotube

Characterization of an Electron Emitting Tip by Field Emission Microscope and Scanning Probe Microscope