Analytical Models for Threshold Voltage, Drain Induced Barrier Lowering Effect of Junctionless Triple-Gate Finfets

Guangxi Hu,Shuyan Hu,Jianhua Feng,Ran Liu,Lingli Wang,Lirong Zheng
DOI: https://doi.org/10.1109/asicon.2015.7517154
2015-01-01
Abstract:Analytical models for threshold voltage, and drain induced barrier lowering effect of the short-channel fin-shaped field-effect transistor (FinFET) are obtained. The analytical model results are verified against simulations, good agreements are observed. The explicit expression for threshold voltage makes the model suitable to be embedded in circuit simulation and design tools.
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