Abstract:Aging effects in digital circuits change the switching characteristics of their transistors, resulting in timing violations that can lead to functional errors at the system level. In particular, bias temperature instability (BTI) is a degradation effect that changes the threshold voltage of transistors. Its effect is more prevalent as the scaling of transistor dimensions progresses. In this work, we present a method to enable defect-centric long-term modeling of BTI degradation that takes into account the effects of concrete workloads at the processor data path level. Based on this study, we propose a novel design flow to link the impact of BTI degradation at the transistor ( ${Delta {}V_{text {th}}}$ ), processor data path (e.g., maximum frequency) and application-functionality levels. This flow may be used to improve system correctness over the entire device lifetime, avoiding unsafe working points, or to achieve a graceful degradation of system characteristics. Our design flow is applicable to all types of digital circuits, including high-performance processors. However, in this specific work we focus on the domain of biosignal processing applications for wireless body sensor networks (WBSNs), the pseudoperiodic nature of which interacts with the partially recoverable nature of BTI. Our results in this domain show, for a 32-nm implementation, a variation of up to 54.6 mV in the threshold voltage of the circuit transistors after one year of continuous operation, with an impact of 8.4% in the maximum safe operating frequency. Such effects are expected to strongly worsen for longer lifetimes and more scaled technology nodes.

NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment Approach

Variation-aware Supply Voltage Assignment for Simultaneous Power and Aging Optimization

Workload-aware failure prediction method for VLSI devices using an LUT based approach

NBTI and Power Reduction Using an Input Vector Control and Supply Voltage Assignment Method

Variation-aware Supply Voltage Assignment for Minimizing Circuit Degradation and Leakage.

On the efficacy of input Vector Control to mitigate NBTI effects and leakage power

Nbti-Aware Dual V-Th Assignment for Leakage Reduction and Lifetime Assurance

NBTI and Leakage Reduction Using an Integer Linear Programming Approach

Temperature-aware NBTI Modeling and the Impact of Input Vector Control on Performance Degradation

Temperature-Aware NBTI Modeling and the Impact of Standby Leakage Reduction Techniques on Circuit Performance Degradation

Minimizing Leakage Power In Aging-Bounded High-Level Synthesis With Design Time Multi-V-Th Assignment

NBTI-aware Adaptive Minimum Leakage Vector Selection Using a Linear Programming Approach

Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques

Gate Replacement Techniques For Simultaneous Leakage And Aging Optimization

Low Power Aging-Aware On-Chip Memory Structure Design by Duty Cycle Balancing.

Temperature-Aware NBTI Modeling Techniques in Digital Circuits.

Proactive Nbti Mitigation for Busy Functional Units in Out-Of-Order Microprocessors

Low Power Aging-Aware Register File Design by Duty Cycle Balancing

Combating NBTI-induced aging in data caches.

Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors

New-Age : A Negative Bias Temperature Instability-Estimation Framework for Microarchitectural Components