A MEMS Accelerometer with Double-Sided Symmetrical Folded-Beams on Single Wafer

Wei Li,Xiaofeng Zhou,Jian Wu,Youling Lin,Ze Wang,Lu Feng Ehe
DOI: https://doi.org/10.1109/nems.2017.8017004
2017-01-01
Abstract:We present a novel MEMS capacitance accelerometer with single wafer symmetrical double-sided folded-beams structure. The highly symmetrical 8 folded-beams on single wafer is designed and fabricated by Deep Reactive Ion Etch (DRIE) and KOH wet etching from both sides of the silicon wafer. The sandwich differential capacitive accelerometer is formed by three-layer silicon-silicon bonding. The excellent performance is obtained by double-sided symmetrical folded-beams structure. The resonance frequency and quality factor are 1.3 kHz and 10, respectively. The sensitivity with closed loop interface circuit is 1.0 V/g, and the nonlinearity is 0.05% over the typical range of 1 g. The bias stability of the fabricated accelerometer is 0.2 mg.
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