Development and validation of a cryogenic far-infrared diffraction grating spectrometer used to post-disperse the output from a Fourier transform spectrometer

Alicia M. Anderson,David A. Naylor,Brad G. Gom,Matthew A. Buchan,Adam J. Christiansen,Ian T. Veenendaal
DOI: https://doi.org/10.1063/5.0177603
IF: 1.6
2024-01-01
Review of Scientific Instruments
Abstract:Recent advances in far-infrared detector technology have led to increases in raw sensitivity of more than an order of magnitude over previous state-of-the-art detectors. With such sensitivity, photon noise becomes the dominant noise component, even when using cryogenically cooled optics, unless a method of restricting the spectral bandpass is employed. The leading instrument concept features reflecting diffraction gratings, which post-disperse the light that has been modulated by a polarizing Fourier transform spectrometer (FTS) onto a detector array, thereby reducing the photon noise on each detector. This paper discusses the development of a cryogenic (4 K) diffraction grating spectrometer that operates over the wavelength range of 285 to 500 μm and was used to post-disperse the output from a room-temperature polarizing FTS. Measurements of the grating spectral response and diffraction efficiency are presented as a function of both wavelength and polarization to characterize the instrumental performance.
instruments & instrumentation,physics, applied
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