Grain Size Effect of V-shaped Multiple Twins in Annealed Nanocrystalline Cu

L. J. Xu,Z. H. Cao,M. Z. Wei,J. Shi,G. J. Pan,X. K. Meng
DOI: https://doi.org/10.1016/j.matlet.2015.01.134
IF: 3
2015-01-01
Materials Letters
Abstract:V-shaped multiple twins have been observed in annealed nanocrystalline Cu by high-resolution transmission electron microscopy. The density of V-shaped multiple twins depends on the grain size remarkably. With decreasing grain size, the amount of V-shaped multiple twins increases initially and then decreases, reaching the maximum at a critical grain size of 40nm and exhibiting an obvious grain size dependence. The formation mechanism of V-shaped multiple twins is proposed based on cooperative grain rotation and grain boundary migration. However, the amount of V-shaped multiple twins decreases significantly below the critical grain size, which is attributed to the grain rotation-mediated single crystal growth.
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