Optical and Dielectric Properties of PbZrO3 Thin Films Prepared by a Sol–gel Process for Energy-Storage Application

T. F. Zhang,X. G. Tang,Q. X. Liu,Y. P. Jiang,L. L. Jiang,L. Luo
DOI: https://doi.org/10.1016/j.matdes.2015.11.012
IF: 9.417
2016-01-01
Materials & Design
Abstract:PbZrO3 thin films with (100) and (111) orientation were prepared by a simple sol–gel method. X-ray diffraction results revealed that post-annealing temperatures played an important role on the orientation of PbZrO3 films. The frequency dependence of dielectric properties and the ferroelectric characteristics were measured. Giant energy-storage density and energy-storage efficiency calculated from hysteresis loops achieved about 25.25J/cm3 and 62% for PbZrO3 film with thickness of 292nm, respectively, results indicated that PbZrO3 thin films had a potential application in energy-storage device. Optical properties of PbZrO3 thin films were analyzed by a spectroscopic ellipsometer, results revealed that (111)-orientated PbZrO3 thin films exhibited higher refractive index than that of the (100)-orientated PbZrO3 thin films.
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