Abstract:Experimental identification method is a fundamental means of determining the spectral properties of semitransparent materials. A series of distinctly different and independent experimental data is usually required so as to provide multiple constraints to feed the retrieval model. However, for high-transparency and low-absorption materials, directional transmittance measurements may encounter unpredictable temperature gradients due to too many outlets on the heating compartment. And the transmittance measurements in a certain direction may confront the problem of low recognition that the transmittances of samples with different acceptable and reasonable thicknesses are undistinguished. To resolve these problems, a rotating-interface method coupling with an identifying procedure was proposed in this study. The rotating-interface method can provide a means of measuring various directional transmittances without additional outlets in the heating cell. There is barely any influence on the temperature field of the sample. Applied on multilayered specimens with various layers, this method could provide more independent and distinctly different transmittances by using as few specimens as possible. And thus the enough transmittance data was used as constraints to feed the retrieval model, guaranteeing the uniqueness and stability of the result. To verify this method, a C-cut sapphire was measured for the low absorption wavelengths throughout 0.35 to 1.1 mu m at temperatures ranging from 300 to 1500 K. And then an experimental identification procedure was performed to retrieve the indexes of refraction and absorption. Considering the incident and detecting solid angles, a Monte-Carlo ray-tracing (MCAT) method was used to predict the experimental transmittances. A genetic algorithm was adopted to search and to optimize the association of refractive index and absorption index, which was brought in the retrieval model of least-square to minimize the difference between the transmittances, measured and predicted. Finally, temperature and wavelength dependence of transmission properties of the C-cut sapphire up to 1500 K were obtained.

Measurement Method for High-Temperature Infrared Optical Constants of ZnS Crystal Materials in a Multi-Layer Structure

Radiation temperature measurement method for semitransparent materials using one-channel infrared pyrometer.

Temperature Measurements of High-Temperature Semi-Transparent Infrared Material Using Multi-Wavelength Pyrometry

Parameters inversion of ZnS multi-phonon absorption model based on the transmissivities in variable temperature

Measured Optical Constants Of Znse Glass From 0.83 Mu M To 2.20 Mu M By A Novel Transmittance Method

[Optical Constants Determination of Zinc Selenide by Inversing Transmittance Spectrogram].

A New Method Of Calculating The Diffraction Efficiency For Diffraction/Refraction Infrared Hybrid System

Athermal design of long-wave infrared optical system with hybrid refractive/diffractive

Determined Optical Constants of ZnSe Glass from 0.83 to 21 μm by Transmittance Spectra: Methods and Measurements

Multi-phonon interaction of ZnS material based on two-dimensional correlation analysis

Spectral Emissivity and Transmissivity Measurement for Zinc Sulphide Infrared Window Based on Integrating-Sphere Reflectometry

Measured optical constants of ZnSe glass from 0.83 μm to 2.20 μm by a novel transmittance method

Optical Temperature Sensor Based On Zno Thin Film'S Temperature-Dependent Optical Properties

Fabrication of an Anti-Reflective Microstructure on ZnS by Femtosecond Laser Bessel Beams

A Rotating-Interface Method for Measuring Optical Constants of Weakly Absorbing Medium at High-Temperature

The Optical Properties of ZnS Dependent on Different Fabricating Process

The Optical Constant of ZnSe/SiO2 Thin Film Investigated by Spectroscopic Ellipometry

The optical constant of ZnSe/SiO 2 composite thin films investigated by spectroscopic ellipsometers

Optical interband transitions in Zn2TiO4 single crystals

Determination of the Optical Constants of Solar-Control Amorphous Silicon Thin Films on Float Glass

Calculate Ir Optical Constants of Si Substrate under High Temperature Condition