Abstract:In situ timing monitoring of critical paths (CPs) can help eliminate the excess timing margin but suffer from miss detection risk because the CPs might not be activated. However, indirect monitoring methods encounter discrepancies between the replica circuit and the actual circuit due to calibration challenges in the replica circuit. We propose a dynamically self-calibrating tunable replica CP (DSC-TRCP)-based adaptive voltage scaling (AVS), which integrates the advantages of both in situ and indirect monitoring methods while overcoming their disadvantages. Our TRCP is dynamically calibrated to follow the selected CPs. We also propose a low-overhead, low-latency timing monitor (called Mini-Razor) inserted at the half-path point to cooperate with TRCP to monitor the timing of the main circuit. Applied on a binary neural network (BNN) accelerator and implemented in a 28-nm CMOS technology, the maximum calibration error between DSC-TRCP and actual CPs does not exceed 2.1% under different process, voltage, and temperature (PVT) variations. Operating at 31 MHz and 0.55 V, the chip provides a 58% reduction in power consumption with only a 0.65% increase in area cost and offers up to 232% frequency gain in the near-threshold region. Our DSC-TRCP achieves high AVS gains with low costs and ensures the effectiveness of monitoring.

A universal delay line circuit for variation resilient IC with self-calibrated time-to-digital converter

New Design of Clock Self Recovery Circuit Based on Time-to-voltage Conversion

A Low-Overhead Timing Monitoring Technique for Variation-Tolerant Near-Threshold Digital Integrated Circuits

An Efficient Path Delay Variability Model for Wide-Voltage-range Digital Circuits

Note: Wide-range and high-resolution on-chip delay measurement circuit with low supply-voltage sensitivity for SoC applications

DSC-TRCP: Dynamically Self-calibrating Tunable Replica Critical Paths Timing Monitoring for Variation Resilient Circuits with Low Cost & Large Power/Frequency Gain

An Improved Timing Monitor For Deep Dynamic Voltage Scaling System

Implementation of A High-Precision and Wide-Range Time-To-Digital Converter with Three-Level Conversion Scheme

Design and Implementation of a High-resolution SRAM Timing Parameters Measuring Circuit

A low-power coarse-fine time-to-digital converter in 65nm CMOS

Design and Test of a Time-to-Digital Converter ASIC Based on a Differential Delay Line

A Wide-Voltage-Range Half-Path Timing Error-Detection System with a 9-Transistor Transition-Detector in 40-Nm CMOS

DSC-TRCP: Dynamically Self-Calibrating Tunable Replica Critical Paths Based Timing Monitoring for Variation Resilient Circuits

A Low Dead Time Vernier Delay Line TDC Implemented in an Actel Flash-Based FPGA

A High-Precision PVT-Tolerance Adaptive Clock Circuit Over Wide Frequencies in 28nm CMOS

Silicon-Based Integrated True-Time Delay Line with Adjustable Large Delays

A Bi-Directional, Zero-Latency Adaptive Clocking Circuit in a 28-Nm Wide AVFS System

A Novel Delay Manager Based on Digital DLL Used to Adjust the Delay Time of FPGA's IO Cell

A High-Resolution Time-To-Digital Converter Based on Parallel Delay Elements

A Novel FPGA-Based Delay-Line Implementation and Interpolation Method Using TDCs

A Simple Steady Timing Resilient Sample Based On Delay Data Sense Detection