Abstract:Even when aberration-corrected electron microscopy is in the ascendant, the microstructural analysis of materials faces the problems of residual aberrations, zone-axis deviation, surface damage, and irradiation damage, which not only have kept the spatial resolution of the electron microscope at about 0.5 Å for years, but also limited the reliability and accuracy of the microstructural analysis. Electron ptychography is a computational imaging method that utilizes the rich information in four-dimensional scanning transmission electron microscopy datasets to obtain high spatial resolution, phase accuracy, and dose efficiency. Recently, the information limit of microscopic imaging has reached 0.14? by local-orbital ptychography. Electron ptychography consists of two stages: data acquisition and numerical reconstruction. In the data acquisition stage, a four-dimensional scanning transmission electron microscopy dataset is formed by recording the two-dimensional diffraction patterns at each position by means of a pixelated detector during the two-dimensional scanning of the electron beam on the sample. In the numerical reconstruction stage, the amplitude and phase of the sample are retrieved from these datasets by means of suitable algorithms. In contrast to aberration correction, which reduces the effect of lens aberrations on the imaging quality, electron ptychography eliminates this effect and achieves aberration-free imaging, reproducing the true structure of the sample nearly perfectly. We briefly introduce the basic principles and algorithms of electron ptychography from the perspective of the main problems faced by the microstructure analysis of materials, and introduce the main features of electron ptychography through application examples.

Characterisation of orientation noise for EBSP technique

Characterisation of Orientation Noise during EBSP Investigation of Deformed Samples

Effect of Orientation Noise on the Determination of Percolation Thresholds from Electron Back-Scatter Pattern Data

EC Signal Pre-Processing Techniques for Scanning Inspection of Defect in Multi-Layered Conductive Structures

Determining dislocation cell sizes for high-strain deformation microstructures using the EBSP technique

Processing and Interpretation of EBSD Data Gathered from Plastically Deformed Metals

A review of the preparation methods and techniques of electron backscatter diffraction (EBSD) samples

An EBSP Study on the Cube Textured Nickel Substrates

Accuracy assessment of crystal orientation indexations by EBSD

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination - accuracy and precision assessment

Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation

Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction

Note: Symmetric Modulation Methodology Applied In Improving The Performance Of Scanning Tunneling Microscopy

Crystallographic orientation assessment by electron backscattered diffraction

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

2D and 3D orientation mapping in nanostructured metals: A review

A New Principle Of Orientation Determination For 3d Electron Diffraction Microscopy

Study on the Orientation Parameter of Excited Sodium Scattered by Electrons

Indexation of electron diffraction patterns at grain boundaries

Introduction to Electron Ptychography for Materials Scientists

A simple, static and stage mounted direct electron detector based electron backscatter diffraction system