Robust electrical characteristics of multiple-layer InAs/GaAs quantum-dot diodes under gamma irradiation

yifei mu,suiyuk lam,c z zhao,n babazadeh,r a hogg,kenichi nishi,k takemasa,mitsuru sugawara
DOI: https://doi.org/10.1109/DRC.2015.7175591
2015-01-01
Abstract:To conclude, the InAs/GaAs QD devices display radiation-tolerant DC characteristics despite high total dose of gamma radiation. No permanent ionising damage to the III-V compound semiconductor devices has been observed. The off-state leakage current is not worsened even when the device is continuously irradiated by gamma radiation. The results show great promise of InAs/GaAs QD structure for realization of IR photodetectors with low noise floor and high reliability in radiation environments.
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