Correlation Of Current - Voltage Characteristics Of Step-Edge Yba2cu3o7 Josephson-Junctions With The Step Angle

K Herrmann,M Siegel,G Kunkel,A Thust,B Kabius,Cl Jia,J Schubert,Ai Braginski
DOI: https://doi.org/10.1117/12.181010
1994-01-01
Abstract:We report on a systematic study of the transport characteristics of YBa2Cu3O7 (YBCO) step-edge Josephson junctions as a function of the step angle. The microstructure of a YBCO film depends very critically on the step angle (alpha) in a SrTiO3 or LaAlO3 substrate. Briefly, on shallow steps (0 < (alpha) < 44 degree(s)) the film grows epitaxially across the step. On steep steps (46 degree(s) < (alpha) < 85 degree(s)) two grain boundaries occur on the step. In this paper it is shown that the I-V curves of the step-edge junction reflect the microstructure of the YBCO film on the step. The I-V curves on shallow steps are of flux-flow type. On 45 degree(s) steps there are several Josephson junctions with different critical currents, while on steep steps two critical currents are found in the I-V curve. Summarizing all data, we conclude that the grain boundaries formed on steep steps are responsible for the Josephson behaviour of the junctions.© (1994) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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