Interface Layer in Colloid by Saxs

ZH Li,YJ Gong,M Pu,D Wu,YH Sun,H Zhao,J Wang,BZ Dong
DOI: https://doi.org/10.1142/9789812776846_0073
2002-01-01
Abstract:Small Angle X-ray Scattering (SAXS) can be used to determine the average thickness E of the interface layers that wrap about colloidal nuclei in colloid system by analyzing the negative deviation of the scattering data from Porod's law. Herein, a new method for determining E is presented on the basis of the analysis of the negative deviation of the slit-smeared scattering data from Debye's theory. This method was tested with experimental SAXS data Of SiO2 colloids prepared under various conditions. The results were close to that derived from the negative deviation from Porod's law. With the increase of the average size of the colloidal nuclei, E reasonably decreased.
What problem does this paper attempt to address?