A Modified High-Resolution TEM for Thermoelectric Properties Measurements of Nanowires and Nanotubes

C. Dames,S. Chen,C. T. Harris,J. Y. Huang,Z. F. Ren,M. S. Dresselhaus,G. Chen
DOI: https://doi.org/10.1117/12.689422
2006-01-01
Abstract:Nanowires are interesting candidates for thermoelectric applications because of their potentially low thermal conductivity and high power factor. However, measurements at the single-wire level are challenging and tend to lack detailed information about the atomic-level structure of the sample and contacts. We are modifying a high-resolution transmission electron microscope (HRTEM) with integrated scanning tunneling microscope (STM) for in-situ measurements of the thermoelectric properties of individual nanowires and nanotubes. A slender hot-wire probe is used to make electrical and thermal contact to the free end of a nanowire or nanotube. The electrical conductance of the nanowire/nanotube can be measured with the usual STM mode of operation. The Seebeck coefficient can be extracted from the transient response to a step change in the joule heating of the hot-wire probe. The thermal conductance can be calculated from the temperature and heat leakage of the hot-wire probe. These measurements are combined with detailed HRTEM observations.
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