Role of Si Implantation in Control of Underlap Length in Schottky-barrier Source/drain MOSFETs on Ultrathin Body SOI

Z. J. Qiu,Z. Zhang,J. Olsson,J. Lu,P. -E. Hellstrom,R. Liu,M. Ostling,S. -L. Zhang
DOI: https://doi.org/10.1109/ulis.2008.4527167
2008-01-01
Abstract:This works demonstrates a novel approach using Si implantation prior to Pt deposition and PtSi formation to control the underlap length between the PtSi source/drain regions to the gate in Schottky-Barrier (SB-) MOSFETs. Dopant segregation at the PtSi/Si interface is used to enhance device performance. With the lon /Ioff current ratio as an indicator, optimized Si implant doses are found for both n- and p-channel SB-MOSFETs. Through an effective barrier width, the underlap length has direct implication on the leakage current.
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