Evaluation of Impurity Levels in Real SOFC Stacks and Modules

Katsuhiko Yamaji,Haruo Kishimoto,Yue-Ping Xiong,Teruhisa Horita,Manuel E. Brito,Harumi Yokokawa
DOI: https://doi.org/10.1149/1.3142738
2009-01-01
ECS Transactions
Abstract:Reliability of SOFC stacks/modules were investigated in NEDO SOFC project from FY2005-FY2007. In this project, the same technique of detecting the impurities inside the cell component using the SIMS (Secondary Ion Mass Spectrometry) machine was applied to four different stacks and modules before and after long term power generation tests. In cathodes, Cr and S were mainly detected. On the other hand, many elements like Na, Al, Si and Sr were detected in anodes. These impurities may come from components in the system or gases like water vapors.
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