Non-volatile Memory with Self-Assembled Ferrocene Charge Trapping Layer

Hao Zhu,Christina A. Hacker,Sujitra J. Pookpanratana,Curt A. Richter,Hui Yuan,Haitao Li,Oleg Kirillov,Dimitris E. Ioannou,Qiliang Li
DOI: https://doi.org/10.1063/1.4817009
IF: 4
2013-01-01
Applied Physics Letters
Abstract:A metal/oxide/molecule/oxide/Si capacitor structure containing redox-active ferrocene molecules has been fabricated for non-volatile memory application. Cyclic voltammetry and X-ray photoelectron spectroscopy were used to measure the molecules in the structure, showing that the molecules attach on SiO2/Si and the molecules are functional after device fabrication. These solid-state molecular memory devices have fast charge-storage speed and can endure more than 109 program/erase cycles. This excellent performance is derived from the intrinsic properties of the redox-active molecules and the hybrid Si-molecular device structure. These molecular devices are very attractive for future high-level non-volatile memory applications.
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