Plane Stress Fracture Toughness Testing of Freestanding Ultra‐Thin Nanocrystalline Gold Films on Water Surface
Myoung Song,Boo Soo Ma,Seung Jin Oh,Taek‐Soo Kim
DOI: https://doi.org/10.1002/smtd.202301220
IF: 12.4
2024-01-27
Small Methods
Abstract:Freestanding ultra‐thin nanocrystalline gold films are directly tested on water surface and observed in situ to systematically evaluate the intrinsic plane stress fracture toughness. Quantitative thickness‐dependent trend is clarified and microstructural analysis elucidate the mechanism. Validations based on linear elastic fracture mechanics theory propose the method as a new standard for revealing the fracture behavior of sub‐100 nm thick films. Fracture toughness, which is the resistance of a material to crack propagation, is a critical material property for ensuring the mechanical reliability of damage‐tolerant design. Recently, damage‐tolerant design is introduced to flexible electronics by adopting micro‐cracked ultra‐thin nanocrystalline (NC) gold films as stretchable electrodes in a plane stress state. However, experimental investigation of the plane stress fracture toughness of those films remains challenging due to the intrinsic fragility from their sub‐100 nm thicknesses. Here, a quantitative method for systematically evaluating the plane stress fracture toughness of freestanding ultra‐thin NC gold film on water surface platform is presented. After effectively fabricating single‐edge‐notched‐tension samples with femtosecond laser, mode I stress intensity factors are measured in the plane stress state on water surface. Moreover, investigation regarding the effect of notch length, notch sharpness, and notch tip plasticity validates this method based on linear elastic fracture mechanics theory. As a demonstration, the thickness‐dependent plane stress fracture toughness of ultra‐thin NC gold films is qualitatively unveiled. It is revealed that the thickness confinement effect on grain boundary sliding induces a transition in fracture behavior. This method is expected to further clarify the fracture‐related properties of various ultra‐thin films for next‐generation electronics.
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology