The Structure Measurement of Micro-Electro-mechanical System Devices by the Optical Feedback Tomography Technology

Chunxin Xu,Yidong Tan,Shulian Zhang,Shijie Zhao
DOI: https://doi.org/10.1063/1.4807283
IF: 4
2013-01-01
Applied Physics Letters
Abstract:We describe a potential way to obtain the images of the surface and internal structure of micro-electro-mechanical system devices by optical feedback tomography technology. By using different materials and various structures of micro devices as the samples, this approach is proved to be able to measure the geometric structure of the micro device, including the internal structure, which makes it possible to detect whether the micro-device tested meets its fabrication requirements. (C) 2013 AIP Publishing LLC.
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