A Broadband Permeability Measurement of Fetan Lamination Stack by the Shorted Microstrip Line Method

Xin Chen,Yungui Ma,Feng Xu,Peng Wang,C. K. Ong
DOI: https://doi.org/10.1063/1.3054181
IF: 2.877
2009-01-01
Journal of Applied Physics
Abstract:In this paper, the microwave characteristics of a FeTaN lamination stack are studied with a shorted microstrip line method. The FeTaN lamination stack was fabricated by gluing 54 layers of FeTaN units with epoxy together. The FeTaN units were deposited on both sides of an 8 μm polyethylene terephthate (Mylar) film as the substrate by rf magnetron sputtering. On each side of the Mylar substrate, three 100-nm FeTaN layers are laminated with two 8 nm Al2O3 layers. The complex permeability of FeTaN lamination stack is calculated by the scattering parameters using the shorted load transmission line model based on the quasi-transverse-electromagnetic approximation. A full wave analysis combined with an optimization process is employed to determine the accurate effective permeability values. The optimized complex permeability data can be used for the microwave filter design.
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