Write-once-read-many-times Characteristics of Pt/Al2O3/ITO Memory Devices

Shuxiang Wu,Xinman Chen,Lizhu Ren,Wei Hu,Fengmei Yu,Kungan Yang,Mei Yang,Yunjia Wang,Meng,Wenqi Zhou,Dinghua Bao,Shuwei Li
DOI: https://doi.org/10.1063/1.4893660
IF: 2.877
2014-01-01
Journal of Applied Physics
Abstract:Nonvolatile write-once-read-many-times (WORM) Pt/Al2O3/ITO memory devices prepared at room temperature were demonstrated. The WORM memory devices show irreversible transition from the initial low resistance (ON) state to the high resistance (OFF) state, high ON/OFF ratio, long data retention, and good reading endurance in air at room temperature. The high performances are promising for employing the Pt/Al2O3/ITO WORM memory devices in permanent storage of information. The nonvolatile memory behaviors could be attributed to the formation and permanent rupture of conductive filament consisting of positively charged oxygen vacancies.
What problem does this paper attempt to address?