Abstract:We report a study of scattering dynamics in crystals employing momentum-resolved scanning transmission electron microscopy under varying illumination conditions. As we perform successive changes of the probe focus, multiple real-space signals are obtained in dependence of the shape of the incident electron wave. With support from extensive simulations, each signal is shown to be characterised by an optimum focus for which the contrast is maximum and which differs among different signals. For instance, a systematic focus mismatch is found between images formed by high-angle scattering, being sensitive to thickness and chemical composition, and the first moment in diffraction space, being sensitive to electric fields. It follows that a single recording at one specific probe focus is usually insufficient to characterise materials comprehensively. Most importantly, we demonstrate in experiment and simulation that the second moment μ20+μ02=〈p2〉 of the diffracted intensity exhibits a contrast maximum when the electron probe is focused at the top and bottom faces of the specimen, making the presented concept attractive for measuring local topography. Given the versatility of 〈p2〉, we furthermore present a detailed study of its large-angle convergence both analytically using the Mott scattering approach, and by dynamical simulations using the multislice algorithm including thermal diffuse scattering. Both approaches are in very good agreement and yield logarithmic divergence with increasing scattering angle.

Imaging Surfaces with Reflected Electrons from A Field Emission Scanning Tunnelling Microscope: Image Contrast Mechanisms

Nanoscale Imaging of Surface Topography and Reactivity with the Scanning Electrochemical Microscope

Note: Symmetric Modulation Methodology Applied In Improving The Performance Of Scanning Tunneling Microscopy

Scanning tunneling microscopy evidences for surface electron scattering by underlying atoms

Space rocks and optimising scanning electron channelling contrast

Scanning Electron Microscopy Imaging of Single-Walled Carbon Nanotubes and Devices

Surface Relaxations, Current Enhancements, and Absolute Distances in High Resolution Scanning Tunneling Microscopy

Advantages of stereo imaging of metallic surfaces with low voltage backscattered electrons in a field emission scanning electron microscope

Electron scattering in atomic force microscopy experiments

Note: Electron Energy Spectroscopy Mapping of Surface with Scanning Tunneling Microscope.

The image contrast of surface steps in reflection electron microscopy

Electric field effects in STM imaging

Diffraction Contrast in Reflection Electron Microscopy—ii. Surface Steps and Dislocations under the Surface

Interpretable and efficient contrast in scanning transmission electron microscopy with a diffraction grating beamsplitter

Scanning Probe Energy Loss Spectroscopy: Angular Resolved Measurements On Silicon And Graphite Surfaces

Scanning probe microscopy of biological samples and other surfaces

Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

Application Of Moire Fringes In Investigations Of Subsurface Imperfections - A Study Of Dislocations And Strain Fields Under The Reconstructed Surface Layer Of Au(001) By Scanning Tunneling Microscopy

Measuring Topographies from Conventional SEM Acquisitions.

Double-Tip Scanning Tunneling Microscope for Surface-Analysis

Scanning tunnelling microscope tip-induced reconstruction on Si(111) √3 × √3 R30°-Ag surface