Microstructure Analysis of Ferroelectric Batio3/Srtio3 Heterostructures on Laalo3 Substrates by High Resolution X-Ray Diffraction

C. Dai,M. Liu,C. R. Ma,C. L. Chen,Y. Lin
DOI: https://doi.org/10.1080/00150193.2014.922836
2014-01-01
Ferroelectrics
Abstract:High-resolution x-ray diffraction has been used to analyze the strain distribution and dislocation densities in epitaxial BaTiO3/SrTiO3 heterostructures. It is found that the initial layer in the heterostructures is important to the epitaxial quality and significantly affects the strain distribution, dislocation density, and the lateral coherence length in the heterostructural thin films.
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