Bipolar Resistive Switching Behaviours in Znmn2o4 Film Deposited on P(+)-Si Substrate by Chemical Solution Deposition

JIWEN XU,ZUPEI YANG,YUPEI ZHANG,XIAOWEN ZHANG,HUA WANG
DOI: https://doi.org/10.1007/s12034-014-0731-9
IF: 1.878
2014-01-01
Bulletin of Materials Science
Abstract:ZnMn2O4 active layer for resistance random access memory (RRAM) was deposited on p(+)-Si substrate by chemical solution deposition. The bipolar resistive switching behaviours of the Ag/ZnMn2O4/p(+)-Si capacitor are investigated. The bipolar resistive switching is reproducible and shows high ON/OFF ratio of' >102 and long retention times of >105 s. The conduction mechanism of the Ag/ZnMn2O4/p(+)-Si capacitor in the low-resistance state (LRS) is ohmic conduction, whereas that of the device in high-resistance state (HRS) successively undergoes Ohm's law, trap-filled-limited and Child's law conduction procedure at room temperature.
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