Low-frequency Electrical Fluctuations in Metal–nanowire–metal Phototransistors

Ming-Pei Lu,Ming-Yen Lu,Ying-Jhe Wang
DOI: https://doi.org/10.1088/0957-4484/25/28/285202
IF: 3.5
2014-01-01
Nanotechnology
Abstract:Using low-frequency noise spectroscopy to explore the physical origins of electrical fluctuations in ZnO nanowire (NW) phototransistors featuring a metal-NW-metal configuration, we have found that bulk mobility scatterings gave rise to electrical fluctuations in the low-gate voltage (VG) regime, providing values of Hooge's constant in the ranges 6.0-9.6 x 10(-3) and 1.9-2.2 x 10(-1) in the dark and under UV excitation, respectively. When moving into the higher VG regime, we assign the electrical fluctuations to an interaction process involving trapping and detrapping of channel carriers by charge traps located near the NW-dielectric interface, suggesting that the mechanism of the electrical fluctuation transitioned from bulk NW-dominated to NW/dielectric interface-dominated regimes. We have also addressed the effective density of interface traps responsible for the electrical fluctuations in the high-V-G region. This report provides physical insight into the origins of electrical fluctuations in NW phototransistors.
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