Quantification of the Zinc Dopant Concentration in GaAs Nanowires

T. Burgess,S. Du,B. Gault,Q. Gao,H. H. Tan,R. Zheng,C. Jagadish
DOI: https://doi.org/10.1109/commad.2012.6472350
2012-01-01
Abstract:The zinc dopant concentration and distribution in GaAs nanowires is quantified by atom probe tomography. Material deposited radially by a vapour-solid process is shown to have a significantly higher dopant concentration in comparison to the core which grows by the vapour-liquid-solid process. Zinc concentrations of up to 7×1019 and 5×1020 atoms/cm3 are measured for core and shell materials respectively. Dopant activation is confirmed by electrical characterization which demonstrates an orders of magnitude increase in nanowire conductivity.
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