Phase-shifting interferometry to determine the absolute diameter of a silicon sphere using a frequency-tunable diode laser

Xuejian Wu,Yan Li,Haoyun Wei,Jitao Zhang
DOI: https://doi.org/10.1109/CLEOE-IQEC.2013.6801197
2013-01-01
Abstract:In this contribution, a chain of temporal synthetic wavelengths, generated by use of a frequency-tunable diode laser calibrated by an optical frequency comb, is used to measure the absolute diameter with an accuracy of 3 nm in air, where the fractional interference phase is measured by phase-shifting interferometry.
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